Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5466663 | Ultramicroscopy | 2017 | 6 Pages |
Abstract
Quantitative analysis of noisy electron spectrum images requires a robust estimation of the underlying background signal. We demonstrate how modern data compression methods can be used as a tool for achieving an analysis result less affected by statistical errors or to speed up the background estimation. In particular, we demonstrate how a multilinear singular value decomposition (MLSVD) can be used to enhance elemental maps obtained from a complex sample measured with energy electron loss spectroscopy. Furthermore, the usage of vertex component analysis (VCA) for a basis vector centered estimation of the background is demonstrated. Arising computational benefits in terms of model accuracy and computational costs are studied.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Jakob Spiegelberg, Ján Rusz, Klaus Leifer, Thomas Thersleff,