Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5466706 | Ultramicroscopy | 2017 | 10 Pages |
Abstract
A combined X-ray and scanning tunneling microscopy (STM) instrument is presented that enables the local detection of X-ray absorption on surfaces in a gas environment. To suppress the collection of ion currents generated in the gas phase, coaxially shielded STM tips were used. The conductive outer shield of the coaxial tips can be biased to deflect ions away from the tip core. When tunneling, the X-ray-induced current is separated from the regular, 'topographic' tunneling current using a novel high-speed separation scheme. We demonstrate the capabilities of the instrument by measuring the local X-ray-induced current on Au(1â¯1â¯1) in 800â¯mbar Ar.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Rik V. Mom, Willem G. Onderwaater, Marcel J. Rost, Maciej Jankowski, Sabine Wenzel, Leon Jacobse, Paul F.A. Alkemade, Vincent Vandalon, Matthijs A. van Spronsen, Matthijs van Weeren, Bert Crama, Peter van der Tuijn, Roberto Felici,