| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5466735 | Ultramicroscopy | 2017 | 8 Pages |
Abstract
Elemental mapping at the atomic scale in aberration-corrected electron microscopes is becoming increasingly widely used. In this paper we describe the essential role of simulation in understanding the underlying physics and thus in correctly interpreting these maps, both qualitatively and quantitatively.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
L.J. Allen,