| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5466767 | Ultramicroscopy | 2017 | 4 Pages |
Abstract
We present a novel sample preparation method that allows correlative 3D X-ray Computed Nano-Tomography (CNT) and Focused Ion Beam Time-Of-Flight Secondary Ion Mass Spectrometry (FIB-TOF-SIMS) tomography to be performed on the same sample. In addition, our invention ensures that samples stay unmodified structurally and chemically between the subsequent experiments. The main principle is based on modifying the topography of the X-ray CNT experimental setup before FIB-TOF-SIMS measurements by incorporating a square washer around the sample. This affects the distribution of extraction field lines and therefore influences the trajectories of secondary ions that are now guided more efficiently towards the detector. As the result, secondary ion detection is significantly improved and higher, i.e. statistically better, signals are obtained.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Agnieszka Priebe, Guillaume Audoit, Jean-Paul Barnes,