| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5466849 | Ultramicroscopy | 2017 | 6 Pages |
Abstract
Electron correlation microscopy (ECM) is a way to measure structural relaxation times, Ï, of liquids with nanometer-scale spatial resolution using coherent electron scattering equivalent of photon correlation spectroscopy. We have applied ECM with a 3.5Â nm diameter probe to Pt57.5Cu14.7Ni5.3P22.5 amorphous nanorods and Pd40Ni40P20 bulk metallic glass (BMG) heated inside the STEM into the supercooled liquid region. These data demonstrate that the ECM technique is limited by the characteristics of the time series, which must be at least 40Ï to obtain a well-converged correlation function g2(t), and the time per frame, which must be less than 0.1Ï to obtain sufficient sampling. A high-speed direct electron camera enables fast acquisition and affords reliable g2(t) data even with low signal per frame.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Pei Zhang, Li He, Matthew F. Besser, Ze Liu, Jan Schroers, Matthew J. Kramer, Paul M. Voyles,