Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5467028 | CIRP Annals - Manufacturing Technology | 2016 | 23 Pages |
Abstract
The field of Large-Scale Metrology has been studied extensively for many decades and represents the combination and competition of topics as diverse as geodesy and laboratory calibration. A primary reason that Large-Scale Metrology continues to represent the research frontier is that technological advances introduced and perfected at a conventional scale face additional challenges which increase non-linearly with size. This necessitates new ways of considering the entire measuring process, resulting in the application of concepts such as virtual measuring processes and cyber-physical systems. This paper reports on the continuing evolution of Large-Scale Metrology.
Related Topics
Physical Sciences and Engineering
Engineering
Industrial and Manufacturing Engineering
Authors
R.H. Schmitt, M. Peterek, E. Morse, W. Knapp, M. Galetto, F. Härtig, G. Goch, B. Hughes, A. Forbes, W.T. Estler,