Article ID Journal Published Year Pages File Type
5467180 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2017 6 Pages PDF
Abstract
Chemical mapping of alkaloids on cross-sections of khat leaves by MeV-SIMS was done at JSI by a pulsed 5.8 MeV 35Cl6+ beam, focused to a diameter of 15 μm, using a linear time-of-flight (TOF) spectrometer with a mass resolution of 500. In addition, measurements of MeV-SIMS mass spectra were performed at Kyoto University by a continuous broad beam of 6 MeV 63Cu4+ ions at an orthogonal TOF spectrometer with a high mass resolution of 11,000. Sections of leaves were analysed and mass spectra obtained at both MeV-SIMS setups were compared. Tissue-level distributions of detected alkaloids are presented and discussed.
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Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
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