| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5467189 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2017 | 4 Pages |
Abstract
Our calculation was employed on silicon-based devices to estimate the size of the proposed cavity and the localized depth of the hole in composed material in micro-PIXE analysis. It was deduced that the presented approach is sensitive to the depth and the size of the hole in the composed material.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Ebrahim Gholami Hatam,