| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5467234 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2017 | 5 Pages |
Abstract
Using molecular-dynamics simulation, we study the impact of 0.5 keV Xe ions at glancing incidence (80° from the surface normal) on a graphene flake supported on a (0 0 0 1) graphite substrate. The step forming at the ascending edge of the flake allows the entrance of glancing-incidence ions into a subsurface channel between graphene layers. We find that subsurface-channeled ions have a high probability to lift the flake off the substrate, while non-channeled projectiles rather damage the flake leading eventually to welding the flake to the substrate by the formation of sp3 bonds.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Yudi Rosandi, Herbert M. Urbassek,