| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5467299 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2017 | 7 Pages |
Abstract
When the single-event mode is used for the whole transport, we observe the good agreement of reference and calculated profile for 50 and 100Â keV electrons. Remaining artifacts are fully vanished, showing a possible transport treatment for energies less than a hundred of keV and accordance with reference for whatever scoring cell dimension, even if the single event method initially intended to support electron transport at energies below 1Â keV. Conversely, results for 500Â keV, 1Â MeV and 3Â MeV undergo a dramatic discrepancy with reference curves. These poor results and so the current unreliability of the method is for a part due to inappropriate elastic cross section treatment from the ENDF/B-VI.8 library in those energy ranges. Accordingly, special care has to be taken in setting choice for calculating electron dose distribution with MCNP6, in particular with regards to dosimetry or nuclear medicine applications.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Rodolphe Antoni, Laurent Bourgois,