Article ID Journal Published Year Pages File Type
5467316 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2017 10 Pages PDF
Abstract
This work aims at measuring the proton induced secondary electron energy spectra from nanometer thin films. Backscattered electron energy spectra were measured within an energy range from 0 to 600 eV using a Retarding Field Analyser (RFA). This paper presents energy spectra obtained for proton (0.5 MeV; 1 MeV; 1.5 MeV; 2 MeV) irradiation of thin carbon films (50 and 100 nm thick) and thin gold film (200 nm). These experimental spectra were compared with Monte Carlo simulations based on TRAX code and Geant4 simulation toolkit. Good agreement between experimental, TRAX and Geant4 results were observed for the carbon target. For the gold target, we report major differences between both Monte Carlo environments. Limitation of Geant4 models for low energy electron emission was highlighted. On the contrary, TRAX simulations present encouraging results for the modeling of low-energy electron emission from gold target.
Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
Authors
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