Article ID Journal Published Year Pages File Type
5467336 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2017 4 Pages PDF
Abstract
We present extreme ultraviolet laboratory spectra of highly charged S IX and S X measured using a compact electron beam ion trap. The data were recorded using a flat-field grazing incidence spectrometer in the wavelength range between 210 and 290 Å. The beam energy was tuned for three different values at 365, 410 and 465 eV while keeping electron beam current constant at 10 mA. By measuring the beam energy dependence, we identified several lines originating from S IX and S X ions with the support of collisional-radiative modeling. We compared them with the present calculations and transitions listed in the NIST data base and found in good agreement.
Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
Authors
, , ,