| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5467440 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2017 | 4 Pages |
Abstract
A method for multi-layer analysis using high energy PIXE is described. It is based on the variation of the KαKβ ratio as a function of the detection angle. Experiments have been carried out at the ARRONAX cyclotron using 70 MeV protons in order to validate this method. The thicknesses and the sequences of simple multi-layers targets and more complex targets with hidden layers have been determined using this method.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
A. Subercaze, A. Guertin, F. Haddad, C. Koumeir, V. Métivier, N. Servagent,