| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5467454 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2017 | 6 Pages |
Abstract
X-ray production differential cross sections induced by C and Si ions with energies from 1Â MeV/u down to 0.25Â MeV/u, produced by the CMAM 5Â MV tandem accelerator, have been measured for thin targets of Ti, Fe, Zn, Nb, Ru and Ta in a direct way. X-rays have been detected by a fully characterized silicon drift diode and beam currents have been measured by a system of two Faraday cups. Measured cross sections agree in general with previously published results. The ECPSSR theory with the united atoms correction gives absolute values close to the experimental ones for all the studied elements excited by C ions and for Ta, Nb and Ru excited by Si ions. For Ti, Fe and Zn excited by Si, the matching with theory is poor since even the ionization cross section is below the measured data.
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Authors
José Emilio Prieto, Alessandro Zucchiatti, Patricia Galán, Pilar Prieto,