| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5467738 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2016 | 5 Pages |
Abstract
The Kossel interferences generated by characteristic X-ray lines produced inside a periodic multilayer have been observed upon proton irradiation, by submitting a Cr/B4C/Sc multilayer stack to 2 MeV protons and observing the intensity of the Sc and Cr Kα characteristic emissions as a function of the detection angle. When this angle is close to the Bragg angle corresponding to the emission wavelength and period of the multilayer, an oscillation of the measured intensity is detected. The results are in good agreement with a model based on the reciprocity theorem. The combination of the Kossel measurements and their simulation, will be a useful tool to obtain a good description of the multilayer stack and thus to study nanometer-thick layers and their interfaces.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Meiyi (å´æ¢
å¿), Karine Le Guen, Jean-Michel André, Vita Ilakovac, Ian Vickridge, Didier Schmaus, Emrick Briand, Sébastien Steydli, Catherine Burcklen, Françoise Bridou, Evgueni Meltchakov, Sébastien de Rossi, Franck Delmotte, Philippe Jonnard,