| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5469612 | Procedia CIRP | 2017 | 5 Pages |
Abstract
The stack of thermography images captured with different excitation frequencies is used to estimate the defect's depth range. With the given thermal diffusivity and the excitation frequency the depth information is calculated. The results are visualized three-dimensionally. The method is validated by the comparison of the experimental results with calibrated coordinate measuring machine data.
Keywords
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Physical Sciences and Engineering
Engineering
Industrial and Manufacturing Engineering
Authors
Sarah Ekanayake, Christopher Isenberg, Robert H. Schmitt,