Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5489187 | Journal of Crystal Growth | 2017 | 5 Pages |
Abstract
A series of wurtzite ZnO and Zn1âxMgxO (x=0.41-0.66) epilayers have been grown on ScAlMgO4 (SCAM) (0001) substrates by plasma-assisted molecular beam epitaxy. X-ray diffraction results indicate that only a barely recognized amount of rocksalt phase exists in the epilayer having the highest MgO content of 66%. The epilayers with 41% and 50% MgO exhibit reasonable full width at half maximum (FWHM) values of 1200-1800â³ for the rocking curve of the (0002)wz reflection. However, both the surface morphology and the FWHM value deteriorate with further addition the MgO content to 66%.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
M.C. Wen, T. Yan, L. Chang, M.M.C. Chou, N. Ye, K.H. Ploog,