Quality improvement of CdZnTe single crystal by ultrasound processing

Intrinsic defects and contaminations removal from the undoped p-type Cd0.96Zn0.04Te single crystals has been achieved by the ultrasound vibration processing at the room temperature. Surface analysis based on Auger Electron Spectroscopy, Energy Dispersive Spectroscopy, and Scanning Electron Spectroscopy shows a significant reconstruction of the crystal surface after processing, namely, the appearance of numerous “volcano craters” and triangle-shaped defects with a typical size of 0.2-5.0 µm. Elemental analysis of these defects shows that they are Te inclusions emerged on the surface. The regular crystal surface outside the defects also displays a considerable enrichment by Te. Distinct presence of copper is found in both the thin surface layer and in the defects emerged on the surface. The surface reconstruction is associated with a remarkable change in the bulk material properties, electrical (an increase in the resistivity by a factor of ∼6) and optical (an IR transmittance increase). A post-polishing following the ultrasound processing makes the CdZnTe material more stable and reliable for a wide range of device applications.