The influence of the concentration of components in magnetic layers on the magnetoresistive properties of three-layer film systems based on FexNi1−x and Cu

Structural-phase composition and magnetoresistive properties of as-deposited three-layer film systems based on ferromagnetic alloy FexNi100−x (F-layers) and Cu (N-layer) obtained by the method of layer-by-layer condensation are studied. It is shown that spin-dependent electron scattering occurs in the layer thickness range of dN = 5-15 nm and dF = 25-40 nm (cNi < 90%) for as-deposited three-layer films. It is established that the maximum value of the isotropic magnetoresistance at room temperature is observed for three-layer Fe50Ni50/Cu/Fe50Ni50/S films with dF ≈ 30 nm and dN ≈ 6 nm that corresponds to the minimum concentration of Ni in magnetic layers, at which their phase composition conforms to the fcc-FeNi. With decreasing sample temperature from 293 K to 120 K, the value of the isotropic magnetoresistance increases 1.2-2.2 times depending on the concentration of components in magnetic layers.