Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5491741 | Physica B: Condensed Matter | 2017 | 21 Pages |
Abstract
Aluminium doped (i.e. 3Â at%) zinc oxide (AZO) thin films were prepared by simple successive ionic layer adsorption and reaction (SILAR) method with different dipping cycles. The structural and surface morphology of AZO thin films were studied by using X-ray diffraction (XRD) and scanning electron microscopy (SEM). The optical parameters such as, transmittance, band gap, refractive index, extinction coefficient, dielectric constant and nonlinear optical properties of AZO films were investigated. XRD pattern revealed the formation of hexagonal phase ZnO and the intensity of the film was found to increase with increasing dipping cycle. The crystallite size was found to be in the range of 29-37Â nm. Scanning Electron Microscope (SEM) images show the presence of small sized grains, revealing that the smoothest surface was obtained at all the films. The EDAX spectrum of AZO conforms the presence of Zn, O and Al. The optical transmittance in the visible region is high 87% and the band gap value is 3.23Â eV. The optical transmittance is decreased with respect to dipping cycles. The room temperature PL studies revealed that the AZO films prepared at (30 cycles) has good film quality with lesser defect density. The third order nonlinear optical parameters were also studied using Z-scan technique to know the applications of deposited films in nonlinear devices. The third order nonlinear susceptibility value is found to be 1.69 Ã 10â7, 3.34 Ã 10â8, 1.33 Ã 10â7and 2.52 Ã 10â7 for AZO films deposited after 15, 20, 25 and 30 dipping cycles.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
D. Joseph Edison, W. Nirmala, K. Deva Arun Kumar, S. Valanarasu, V. Ganesh, Mohd. Shkir, S. AlFaify,