Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5492512 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2018 | 10 Pages |
Abstract
A new goniometer setup for energy-dispersive X-ray diffraction is introduced which is based on simultaneous data acquisition with two detectors D1 and D2, both of them freely movable in a horizontal as well as in a vertical plane. From the multitude of measurement configurations that can be realised with this setup, we figured out three efficient concepts which aim at the fast analysis of residual stress depth profiles by combining the diffraction data gathered with the two detectors. The characteristic feature of the first two configurations consists in the vertical (horizontal) positioning of the first (second) detector, which results in a diffraction geometry where the two scattering vectors span a plane that coincides with the X-circle used for sample tilt. Because each detector does see the sample under another viewing angle, both the positive and the negative Ï-branch are covered by just one Ï-tilt between 0°and 90°(configuration 1) and 0°and 60°(configuration 2), thus allowing for the simultaneous analysis of the in- and out-of-plane residual stress depth gradients ÏiiÏ and Ïi3Ï (i=1,2), respectively, from data sets dD1hklÏ and dD2hklÏ. The third configuration introduced in this paper is based on a Ï-rotation of the sample under a constant tilt angle Ï and enables a fast and reliable tracing of shear stress fields Ïi3Ï (i=1, 2).
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
Daniel Apel, Matthias Meixner, Alexander Liehr, Manuela Klaus, Sebastian Degener, Guido Wagener, Christian Franz, Wolfgang Zinn, Christoph Genzel, Berthold Scholtes,