| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5492846 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2017 | 4 Pages |
Abstract
This contribution explains how the various defects appear in the data and in which order the defects can be recognized. The method has been used to find strip defects on 30 double-sided trapezoidal microstrip sensors for the Belle II Silicon Vertex Detector, which have been measured at the Institute of High Energy Physics, Vienna (Austria).
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
Manfred Valentan,