A novel X-ray spectrometer for plasma hot spot diagnosis

A novel X-ray spectrometer is designed to diagnose the different conditions in plasmas. It can provide both X-ray spectroscopy and plasma image information simultaneously. Two pairs of elliptical crystal analyzers are used to measure the X-ray spectroscopy in the range of 2-20 keV. The pinhole imaging system coupled with gated micro-channel plate(MCP) detectors are developed, which allows 20 images to be collected in a single individual experiment. The experiments of measuring spectra were conducted at “Shenguang-II upgraded laser” in China Academy of Engineering Physics to demonstrate the utility of the spectrometer. The X-ray spectroscopy information was obtained by the image plate(IP). The hot spot imaging experiments were carried out at “Shenguang-III prototype facility”. We have obtained the hot sport images with the spectrometer, and the signal to noise ratio of 30∼40 is observed.