| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5493302 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2017 | 14 Pages |
Abstract
By means of Micro Electro Mechanical System (MEMS) technology, tynodes and test samples have been realized. The secondary electron yield of several samples has been measured in three different setups. Finally, several possibilities to improve the yield are presented.
Keywords
FSEConduction band minimumDynodeSEYGEANTUHVRSENEATSEDFCBSECBMMEMSALDelectron affinitySecondary electron emissionImagingSecondary electron yieldSurface terminationUltra high vacuumSEEAtomic layer depositionCMOSPhotomultiplierSEMcomplementary metal oxide semiconductorscanning electron microscopeNegative Electron AffinityPixelWork function
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
Harry van der Graaf, Hassan Akhtar, Neil Budko, Hong Wah Chan, Cornelis W. Hagen, Conny C.T. Hansson, Gert Nützel, Serge D. Pinto, Violeta ProdanoviÄ, Behrouz Raftari, Pasqualina M. Sarro, John Sinsheimer, John Smedley, Shuxia Tao,