| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5497280 | Physics Procedia | 2016 | 7 Pages |
Abstract
High spatial resolution thin CsI:Tl scintillator films was prepared by thermal deposition method for X-ray imaging applications. We fabricated CsI:Tl scintillators ranging from 2 μm to 14 μm in thickness. We measured spacial resolution and light yield as a function of input photons energy (5-40 keV) and film thickness. To improve spatial resolution of films carbon post-deposition treatments was performed.
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Authors
E.A. Kozyrev, K.E. Kuper, A.G. Lemzyakov, A.V. Petrozhitskiy, A.S. Popov,