Methods of Angular Scanning in X-ray Imaging and Topography

In an imaging experiment with the use of X-ray topography or phase contrast techniques, generally, the result is a single image, which represents the internal structure of the object. However, identification of the features of the observed structure is a challenge. In these methods, an important parameter is the scattering angle, and methods based on its variation are being actively developed, making possible to obtain a scattering characteristics for each local region of a sample. The present paper discusses the results of applying the methods of the angular scanning to some experiments on synchrotron topography and analyser based imaging.