Study on spectroscopic properties and effects of tungsten ions in 2Bi2O3-3GeO2/SiO2 glasses

The 2Bi2O3-3GeO2/SiO2 glass samples have been prepared by the conventional melt quenching technique. XRD patterns, absorption spectra, excitation-emission spectra and Raman measurements were utilized to characterize the synthesized glasses. When substitute SiO2 for GeO2, the 0.4Bi2O3-(0.4-0.1)GeO2-(0.2-0.5)SiO2 glasses exhibit strong emission centered at about 475 nm (under 300 nm excitation), and the decay constants are within the scope of 20-40 ns. W doping into 2Bi2O3-3SiO2 glass could increase the emission intensity of 470 nm, and the W-doped 2Bi2O3-3SiO2 glass has shown another emission at about 433 nm with much shorter decay time (near 10 ns). The 2Bi2O3-3GeO2/SiO2 glass system could be the possible candidate for scintillator in high energy physics applications.