Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5755558 | International Journal of Applied Earth Observation and Geoinformation | 2017 | 9 Pages |
Abstract
Utilizing remote sensing techniques to extract soil properties can facilitate several engineering applications for large-scale monitoring and modeling purposes such as earthen levees monitoring, landslide mapping, and off-road mobility modeling. This study presents results of statistical analyses to investigate potential correlations between multiple polarization radar backscatter and various physical soil properties. The study was conducted on an approximately 3Â km long section of earthen levees along the lower Mississippi river as part of the development of remote levee monitoring methods. Polarimetric synthetic aperture radar imagery from UAVSAR was used along with an extensive set of in situ soil properties. The following properties were analyzed from the top 30-50Â cm of soil: texture (sand and clay fraction), penetration resistance (sleeve friction and cone tip resistance), saturated hydraulic conductivity, field capacity, permanent wilting point, and porosity. The results showed some correlation between the cross-polarized (HV) radar backscatter coefficients and most of these properties. A few soil properties, like clay fraction, showed similar but weaker correlations with the co-polarized channels (HH and VV). The correlations between the soil properties and radar backscatter were analyzed separately for the river side and land side of the levee. It was found that the magnitude and direction of the correlation for most of the soil properties noticeably differed between the river and the land sides. The findings of this study can be a good starting point for scattering modelers in a pursuit of better models for radar scattering at cross polarizations which would include more diverse set of soil parameters.
Related Topics
Physical Sciences and Engineering
Earth and Planetary Sciences
Computers in Earth Sciences
Authors
Deok Han, Farshid Vahedifard, James V. Aanstoos,