Article ID Journal Published Year Pages File Type
5789296 Science Bulletin 2015 5 Pages PDF
Abstract
Electron beam (e-beam) irradiation is an inevitable, but crucial issue for electron microscopy. Our investigation results show the e-beam-induced in situ structural transformations in silicon (Si) nanowires and zinc oxide (ZnO) nanowires (NWs), respectively. Crystal to amorphous structure transition was revealed in Si NWs utilizing high resolution electron microscopy and electron energy loss spectroscopy. Reconstruction at the (10ī0) surface of ZnO NWs was also observed in the transmission electron microscope (TEM) using aberration-corrected electron microscopy. These e-beam-induced in situ structural transformations prove that the electron beam irradiation effect is able to be used for the local modification of one-dimensional nanomaterials.
Related Topics
Physical Sciences and Engineering Chemistry Chemistry (General)
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