Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5915252 | Journal of Structural Biology | 2007 | 14 Pages |
Abstract
Transmission electron microscopy, as most imaging devices, introduces optical aberrations that in the case of thin specimens are usually modeled in Fourier space by the so-called contrast transfer function (CTF). Accurate determination of the CTF is crucial for its posterior correction. Furthermore, the CTF estimation must be fast and robust if high-throughput three-dimensional electron microscopy (3DEM) studies are to be carried out. In this paper we present a robust algorithm that fits a theoretical CTF model to the power spectrum density (PSD) measured on a specific micrograph or micrograph area. Our algorithm is capable of estimating the envelope of the CTF which is absolutely needed for the correction of the CTF amplitude changes.
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Authors
C.O.S. Sorzano, S. Jonic, R. Núñez-RamÃrez, N. Boisset, J.M. Carazo,