Effects of sodium hypochlorite on gutta-percha and Resilon cones: An atomic force microscopy and scanning electron microscopy study

The aim of this study was to evaluate the effects of 6% sodium hypochlorite (NaOCl) on gutta-percha (GP) and Resilon cones. Six standardized GP and Resilon cones were selected and cut 3mm from their tip. One GP and 1 Resilon cone were used as control samples. Cones were immersed in 6% NaOCl for 1, 5, 10, 20, and 30 minutes, thoroughly rinsed with nanopure water, and dried with filter paper. Then, surface topography was analyzed by atomic force microscopy and scanning electron microscopy coupled to an energy-dispersive x-ray (EDX) spectrometer. According to the root mean square and depth analysis values obtained from atomic force microscopic evalution, there were no significant differences found among the GP groups. However significant differences were found among Resilon cones (P ≤ .05). SEM images and EDX graphics showed that there were no prominent differences between GP and Resilon groups. These results showed that 6% NaOCl solution can be used in the disinfection of GP and Resilon cones. No alterations were observed on the GP cones, but it can change the surface of Resilon cones.