Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
615981 | Tribology International | 2010 | 5 Pages |
Abstract
In this paper, results from an optical technique for measuring surface roughness using image analysis of speckle pattern images are presented. The technique coined as statistical properties of binary images (SPBI) utilizes the combined effects of speckle and scattering phenomena. The speckle patterns obtained with a He-Ne laser were binarized and examined. The parameters such as bright and dark regions and their ratios obtained from this model to evaluate the surface roughness were compared with the surface roughness parameter Ra obtained from a profilometer. It was found that there is a strong relationship between these parameters and Ra, especially in the range of λ
Keywords
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Physical Sciences and Engineering
Chemical Engineering
Colloid and Surface Chemistry
Authors
Ersin Kayahan, Hasan Oktem, Fikret Hacizade, Humbat Nasibov, Ozcan Gundogdu,