Pressure solution of quartz aggregates under low effective stress (0.42-0.61 MPa) at 25-45 °C

Dissolution rates of pressure solution (PS) for quartz aggregates in 0.002 M NaHCO3 solution were experimentally determined under low effective stress conditions of 0.42-0.61 MPa, and low temperatures of 25-45 °C. At temperatures of 25 °C, 35 °C, and 45 °C, the resultant silicon dissolution rates are 4.2 ± 1.2 × 10−15, 6.0 ± 1.0 × 10−15 and 7.8 ± 1.9 × 10−15 mol/cm2/s, respectively. Ratios between these dissolution rates and those of quartz sand at zero effective stress are 4.1 ± 1.2 at 25 °C, 3.0 ± 0.5 at 35 °C, and 2.4 ± 0.6 at 45 °C. As the uniaxial pressure was increased, the dissolution rate of PS also increased, though gradually decreased when the effective stress was kept constant. After the removal of stress, the dissolution rate was observed to increase once again. The activation energy of our PS experiments was determined to be approximately 24 kJ/mol, lower than the amount required for quartz sand dissolution to commence at zero effective stress. Our results clearly show that, even at such low temperature and effective stress, Si released into solution as a result of PS can be detected. This implies that experimental compaction of quartz aggregates can be measured even under such condition.