| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6347239 | Remote Sensing of Environment | 2013 | 17 Pages |
Abstract
⺠A corn yield estimation model was developed by incorporating a crop phenology detection method. ⺠Model calibration and validation were conducted on both field and regional scales. ⺠WDRVI taken 7-10 days before silking stage accurately estimated corn grain yield. ⺠The model revealed spatial patterns of corn grain yield all over the U.S. for over a decade.
Keywords
Related Topics
Physical Sciences and Engineering
Earth and Planetary Sciences
Computers in Earth Sciences
Authors
Toshihiro Sakamoto, Anatoly A. Gitelson, Timothy J. Arkebauer,