Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
638901 | Journal of Membrane Science | 2006 | 8 Pages |
Abstract
Atomic force microscopy (AFM) was used to characterize the surface morphology of uni-axially stretched and non-stretched microporous microfiltration (MF) membranes. The effect of stretching on the pore structure and bulk properties of MF membranes has been previously reported [J.A. Morehouse, L.S. Worrel, D.L. Taylor, D.R. Lloyd, B.D. Freeman, D.F. Lawler, The effect of uni-axial orientation on macroporous membrane structure, J. Porous Mater. 13 (2006) 63–75.]; this paper focuses solely on the use of AFM to characterize the surface of stretched and non-stretched MF membranes. A new way of representing surface roughness that may prove useful in relating roughness to performance in cross-flow applications is presented.
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Filtration and Separation
Authors
Jason A. Morehouse, Dana L. Taylor, Douglas R. Lloyd, Desmond F. Lawler, Benny D. Freeman, Leah S. Worrel,