Article ID Journal Published Year Pages File Type
638901 Journal of Membrane Science 2006 8 Pages PDF
Abstract

Atomic force microscopy (AFM) was used to characterize the surface morphology of uni-axially stretched and non-stretched microporous microfiltration (MF) membranes. The effect of stretching on the pore structure and bulk properties of MF membranes has been previously reported [J.A. Morehouse, L.S. Worrel, D.L. Taylor, D.R. Lloyd, B.D. Freeman, D.F. Lawler, The effect of uni-axial orientation on macroporous membrane structure, J. Porous Mater. 13 (2006) 63–75.]; this paper focuses solely on the use of AFM to characterize the surface of stretched and non-stretched MF membranes. A new way of representing surface roughness that may prove useful in relating roughness to performance in cross-flow applications is presented.

Related Topics
Physical Sciences and Engineering Chemical Engineering Filtration and Separation
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