Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6421673 | Applied Mathematics and Computation | 2014 | 8 Pages |
Abstract
In this paper, we study parallel and consecutive-k-out-of-n:F systems consisting of components which are subject to random deterioration with time. The random deterioration in resistance of a component is defined through a stochastic process. We obtain lifetime distribution of a parallel system via classical probabilistic techniques. The lifetime distribution of a consecutive-k-out-of-n:F system is derived using the lifetime distribution of parallel systems and the concept of maximal signature. We also study the optimal replacement time for a parallel system. We present illustrative computational results using MATHCAD.
Related Topics
Physical Sciences and Engineering
Mathematics
Applied Mathematics
Authors
Serkan Eryilmaz,