Article ID Journal Published Year Pages File Type
6421673 Applied Mathematics and Computation 2014 8 Pages PDF
Abstract

In this paper, we study parallel and consecutive-k-out-of-n:F systems consisting of components which are subject to random deterioration with time. The random deterioration in resistance of a component is defined through a stochastic process. We obtain lifetime distribution of a parallel system via classical probabilistic techniques. The lifetime distribution of a consecutive-k-out-of-n:F system is derived using the lifetime distribution of parallel systems and the concept of maximal signature. We also study the optimal replacement time for a parallel system. We present illustrative computational results using MATHCAD.

Related Topics
Physical Sciences and Engineering Mathematics Applied Mathematics
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