Article ID Journal Published Year Pages File Type
6423129 Journal of Computational and Applied Mathematics 2011 9 Pages PDF
Abstract

This paper is concerned with the mean, minimum and maximum distances between two successive failures in a binary sequence consisting of Markov dependent elements. These random variables are potentially useful for the analysis of the frequency of critical events occurring in certain stochastic processes. Exact distributions of these random variables are derived via combinatorial techniques and illustrative numerical results are presented.

Related Topics
Physical Sciences and Engineering Mathematics Applied Mathematics
Authors
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