Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6472915 | Electrochimica Acta | 2016 | 9 Pages |
Abstract
The Voigt measurement model, developed in the 1990s for identification of the error structure of impedance measurements, is shown here to have utility in identifying resistivity distributions that give rise to frequency dispersion. The analysis was validated by application to synthetic data derived from a constant-phase-element model, a power-law distribution of resistivity, and an exponential distribution corresponding to a Young impedance. The application to experimental data obtained from coated aluminum demonstrates its utility for interpretation of impedance measurements.
Keywords
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Physical Sciences and Engineering
Chemical Engineering
Chemical Engineering (General)
Authors
Yu-Min Chen, Anh Son Nguyen, Mark E. Orazem, Bernard Tribollet, Nadine Pébère, Marco Musiani, Vincent Vivier,