| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6534255 | Solar Energy Materials and Solar Cells | 2018 | 5 Pages |
Abstract
An image-processing method combined with Fourier analysis is introduced in this work as a rapid and highly-automated method of detecting rear contact voids in passivated emitter and rear contact cells (PERC). This approach utilizes photoluminescence (PL) imaging to locate the central point of the most detrimental type of voids and associate a void fraction to each cell in a manner of seconds. Acoustic microscopy and scanning electron microscopy are also used as complementary tools to confirm the presence of voids detection using PL imaging and provide more insight into the actual physical mechanism of what is observed in PL measurements.
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Authors
Kortan ÃÄütman, Kristopher O. Davis, Haider Ali, Steven R. Martell, Winston V. Schoenfeld,