Article ID Journal Published Year Pages File Type
668601 International Journal of Thermal Sciences 2013 8 Pages PDF
Abstract
► We develop GaN HEMT process and determine their thermal and electrical properties. ► DC and pulsed current-voltage characteristics for power operation are measured. ► IR thermography yields large-scale temperature maps of packages during operation. ► Source to drain micro-scale temperature scans are obtained from Raman spectroscopy.
Related Topics
Physical Sciences and Engineering Chemical Engineering Fluid Flow and Transfer Processes
Authors
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