Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
668601 | International Journal of Thermal Sciences | 2013 | 8 Pages |
Abstract
⺠We develop GaN HEMT process and determine their thermal and electrical properties. ⺠DC and pulsed current-voltage characteristics for power operation are measured. ⺠IR thermography yields large-scale temperature maps of packages during operation. ⺠Source to drain micro-scale temperature scans are obtained from Raman spectroscopy.
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Fluid Flow and Transfer Processes
Authors
Stone Cheng, Po-Chien Chou,