Numerical calculation of multiple scattering with the layer model

The optical measurement technique based on Mie scattering has been applied to various areas, in which single scattering at low particle concentration is assumed. Nevertheless, since multiple scattering is usually unavoidable in online measurements, we present in this work a multiple scattering calculation method, in which a layer model is employed. The three-dimensional particle system is divided into a pile of layers the number of which is automatically determined, depending on the obscuration of the particle system. The calculation is found to be fast, reasonable and reliable.