Characterization of superconducting wires and cables by X-ray micro-tomography

Due to their mechanical strength and ability to withstand the large electromagnetic force applied to the superconductors in large magnets during excitation, the Cable-in-Conduit-Conductor (CICC) type superconductors will be employed in the next stage of fusion magnets. Here, we discuss the recent results on the application of a non-invasive method for the characterization of CCIC by X-ray micro-tomography (μXCT). The experiments have been carried out on a high resolution X-ray tomograph in INFLPR (http://tomography.inflpr.ro). An open type nanofocus X-ray source with maximum high voltage of 225 kVp at 15-30 W maximum power and multiple targets of W on different windows materials (Be, Al, Cu or diamond) is the main component. X-rays are detected by means of amorphous silicon flat panel sensor in the cone-beam configuration and high-energy efficient line sensor based on individual scintillators in the fan-beam scanning configuration. The quality of tomographic images (≈40 μm space resolution) allowed the majority of strands of analyzed CICC samples to be fully reconstructed along the investigated segment (up to 300 mm long). Our method provides: (i) local and global void fractions (over a 300 mm length of the sample), (ii) void homogeneity factor as the ratio between void space surface and perimeter and (iii) twist pitch angle of individual strands and its distribution in 3D. It can be used to investigate superconducting CICC during their manufacture, installation or after service inspection, for purposes of QA, characterization or development.