| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7005216 | Wear | 2012 | 9 Pages |
Abstract
⺠A method for friction film analysis based on EDX spectra is presented. ⺠EDX spectra are acquired at variable voltage and compared to Monte Carlo simulation. ⺠The comparison allows to obtain information on layering, composition, and thickness.
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Colloid and Surface Chemistry
Authors
M.A.Z. Vasconcellos, Márcio R.F. Soares, Ruth Hinrichs,