| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7104885 | Journal of the Taiwan Institute of Chemical Engineers | 2018 | 8 Pages |
Abstract
The cyano defects were successfully introduced into the g-C3N4 framework by KOH etching and could contribute to improve the nitrogen photofixation ability of g-C3N4.65
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Process Chemistry and Technology
Authors
Ning Zhou, Pengxiang Qiu, Huan Chen, Fang Jiang,