Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7116676 | The Journal of China Universities of Posts and Telecommunications | 2017 | 9 Pages |
Abstract
Novel high power supply rejection ratio (PSRR) high-order temperature-compensated subthreshold metal-oxide-semiconductor (MOS) bandgap reference (BGR) is proposed in Semiconductor Manufacturing International Corporation (SMIC) 0.13 μm complementary MOS (CMOS) process. By adopting subthreshold MOS field-effect transistors (MOSFETs) and the piecewise-curvature temperature-compensated technique, the output reference voltage's temperature performance of the subthreshold MOS BGR is effectively improved. The subthreshold MOS BGR achieves high PSRR performance by adopting the technique of pre-regulator. Simulation results show that the temperature coefficient (TC) of the subthreshold MOS BGR is 1.38Ã10â6/°C when temperature is changed from â40 °C to 125 °C with a power supply voltage of 1.2 V. The subthreshold MOS BGR achieves the PSRR of â104.54 dB, â104.54 dB, â104.5 dB, â101.82 dB and â79.92 dB at 10 Hz, 100 Hz, 1 kHz, 10 kHz and 100 kHz respectively.
Keywords
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
Zhou Qianneng, Zhu Ling, Li Hongjuan, Lin Jinzhao, Wang Liangcai, Luo Wei,