Article ID Journal Published Year Pages File Type
7119194 Materials Science in Semiconductor Processing 2015 5 Pages PDF
Abstract
Single crystal of the ternary semi-conductor AgInSe2 has been grown by Bridgman technique. The AgInSe2 crystal crystallizes in the tetragonal chalcopyrite structure. Using melt temperature oscillation method polycrystalline charge was synthesized. The synthesized charge was subjected to powder X-ray diffraction analysis. Thermal property of AgInSe2 was analyzed using differential scanning calorimetry (DSC) technique. The melting and solidification temperature is 777 °C and 761 °C respectively. The synthesized polycrystalline charge was employed to grow AgInSe2 single crystals. The grown crystal was confirmed by single crystal X-ray diffraction. The crystal exhibits 60% transmission in the Infrared region. The stoichiometric composition of AgInSe2 was confirmed by Energy dispersive X-ray analysis (EDAX). The electrical properties of the crystal were studied by Hall Effect measurements and photoconductivity.
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Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
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