Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7120809 | Measurement | 2018 | 5 Pages |
Abstract
Measurements are performed for five levels of water content of the stone samples, and the empirical relationship between each considered water content level and the corresponding resonance frequency of the patch resonator are derived. To enhance the contact between the planar resonator and the rough surface of the stone, the patch is covered with a thin layer of soft silicon conductor. The obtained results demonstrate the robustness of the presented solution.
Related Topics
Physical Sciences and Engineering
Engineering
Control and Systems Engineering
Authors
Emanuele Piuzzi, Erika Pittella, Stefano Pisa, Andrea Cataldo, Egidio De Benedetto, Giuseppe Cannazza,