| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7122855 | Measurement | 2016 | 7 Pages |
Abstract
A method for measuring the d-spacing on scale of nanometers of a crystalline sample with a standard small angle X-ray scattering (SAXS) setup by moving either the sample or detector, instead of directly measuring sample-to-detector distance is presented. The formulae of the d-spacing and its errors are derived. The error variation is analyzed in detail by simulation. The effectiveness of the method is further verified by the experiments on a standard sample.
Related Topics
Physical Sciences and Engineering
Engineering
Control and Systems Engineering
Authors
Yanru Wei, Zhihong Li,