| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7125430 | Measurement | 2014 | 5 Pages |
Abstract
Display pixels of liquid-crystal-display televisions (LCD TVs) on thin-film-transistor (TFT) array are getting smaller. This paper introduced the method of voltage imaging technique, which developed and provides initial insight into the thin-film-transistor array flaw detection and measurement for ultra-high-definition (Ultra HD, UHD) LCD TV application. We proposed the measurement of flaw detection, based on TFT array testing and characterization with respect to opto-electric transformation measurement.
Keywords
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Physical Sciences and Engineering
Engineering
Control and Systems Engineering
Authors
Yao-Chin Wang, Bor-Shyh Lin, Kei-Hsiung Yang,