Article ID Journal Published Year Pages File Type
7130986 Optics & Laser Technology 2013 6 Pages PDF
Abstract
We report on the optical characterization, including linear and non linear, of ZnO nanoplates embedded in PVA. Nonlinear optical characterization of these films was studied by the Z-scan technique using an Nd:YAG laser (532 nm, 7 ns, 10 Hz).The studies show that the material is highly nonlinear, have desirable lower optical liming threshold of 46.86 MW/cm2 at pump power of 436 MW/cm2 and with negative refractive index. Therefore, these films with immobilized semiconductor nanoplates appear to be attractive candidates for optical limiting applications.
Related Topics
Physical Sciences and Engineering Engineering Electrical and Electronic Engineering
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